Measurements of Optical Scatter versus Annealing Temperature for Ta2O5 and Ti:Ta2O5 thin-film coatings

ORAL

Abstract

Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal formation and growth during annealing plays in this scatter. We present results of measuring scatter while annealing Ta2O5 and Ti:Ta2O5 thin-film coatings to high temperatures in vacuum.

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Authors

  • Elenna Capote

    • California State University, Fullerton

  • Joshua Smith

    • California State University, Fullerton

  • Amy Gleckl

    • California State University, Fullerton

  • Jazlyn Guerrero

    • California State University, Fullerton

  • Erick Engelby

    • California State University, Fullerton

  • Michael Rezac

    • California State University, Fullerton