Measuring Quasiparticle Diffusion in Superconducting Aluminum Films with a TES and Microscopic Laser-Scanning Technique
ORAL
Abstract
We present preliminary data from a laser-scanning microscopy-based technique for measuring 100µm-scale quasiparticle (QP) diffusion in superconducting Al films. QP are produced at a localized origin in the Al film using a focused 1550nm laser coupled to a single-mode optical fiber mounted on piezoelectric nanopositioners. The resulting QP propagation can then be monitored using a transition edge sensor (TES), and described using a simple diffusion model.
*This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Workforce Development for Teachers and Scientists, Office of Science Graduate Student Research (SCGSR) program. The SCGSR program is administered by the Oak Ridge Institute for Science and Education for the DOE under contract number DE-SC0014664.
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Presenters
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David Z Osterman
- University of Massachusetts Amherst