Optical properties of vanadium doped ZnTe thin cermet films

ZnTe:V thin cermet films (containing 0 to 10wt{\%} V in ZnTe matrix) were prepared onto glass substrate by e-beam evaporation in vacuum at $\sim $0.0001 Pa. The deposition rate of the films was at about 2.05 nm/s. The effects of various deposition conditions on the electrical and optical properties of the cermet films have been studied in detail. The structure analysis of the film was performed by X-ray diffraction technique and it was found that the films are amorphous in nature. The optical properties of both the as-deposited and annealed films were studied in the wavelength range 300$<$lambda$<$2500 nm, respectively. For both types of cermet sample, the values of Urbach tail, optical band gap, refractive index and dielectric constants were evaluated for different compositions and thicknesses, respectively. Evaluation of these parameters may help in view of their technological applications in selective surface as well as in optoelectronic devices.