Characterization of the single atom optical trap
POSTER
Abstract
Individually trapped neutral atoms are promising candidate for quantum information processing. It is challenging to characterize the atom trapping environment and atom temperature for single atoms in contrast to many-atom traps. In this work, we are developing new techniques to accurately characterize these important quantities.
Authors
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Chung-Yu Shih
Georgia Institute of Technology
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Michael Gibbons
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Michael Chapman
Georgia Institute of Technology