Atom Trap Trace Analysis Reaches a Part-per-quadrillion Sensitivity
ORAL
Abstract
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Authors
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Wei Jiang
Physics Div, Argonne National Lab, Argonne National Lab, Illinois 60439, USA
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William Williams
Physics Div, Argonne National Lab, Argonne National Lab, Illinois 60439, USA
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K. Bailey
Argonne National Laboratory, Physics Div, Argonne National Lab, Argonne National Lab, Illinois 60439, USA, Argonne National Lab
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Andrew Davis
Univ of Chicago, Univ of Chicago, USA
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Shuiming Hu
Hefei National Lab, Univ of Sci \& Tech of China, USTC, Hefei, China
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Zheng-Tian Lu
Physics Division, Argonne National Laboratory; The Department of Physics and Enrico Fermi Institute, The University of Chicago, Argonne National Laboratory, Physics Div, Argonne National Lab, Univ of Chicago, Argonne National Lab, Illinois 60439, USA
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T.P. O'Connor
Argonne National Laboratory, Physics Div, Argonne National Lab, Argonne National Lab, Illinois 60439, USA, Argonne National Lab
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Roland Purtschert
Univ of Bern, Univ of Bern, Bern, Switzerland
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Neil Sturchio
Univ of Chicago, Univ of Illinois, Chicago, USA
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Yun Sun
Hefei National Lab, Univ of Sci \& Tech of China, USTC, Hefei, China
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P. Mueller
Argonne National Laboratory, Physics Div, Argonne National Lab, Argonne National Lab, Illinois 60439, USA, Argonne National Lab