Atom Trap Trace Analysis for radiokrypton and radioargon dating

POSTER

Abstract

Atom Trap Trace Analysis (ATTA), a MOT-based atom counting method, is used to analyze three noble gas radioisotopes ($^{81}$Kr, $^{85}$Kr, $^{39}$Ar) covering a wide range of geological ages and applications in the earth sciences. Their isotopic abundances are extremely low, in the range of 10$^{-16}$ -- 10$^{-11}$. Yet, ATTA can trap and unmistakably detect these rare isotopes one atom at a time. The system is currently limited by the excitation efficiency of the RF discharge that produces the metastable atoms (Kr* {\&} Ar*) needed for laser trapping. To further improve the MOT loading rate, we plan to replace the RF discharge with a photon excitation scheme that employs a VUV light source at 124 nm. The VUV source can be a lamp or a free electron laser.

Authors

  • William Williams

    Physics Div, Argonne National Lab, Argonne National Lab, Illinois 60439, USA

  • Wei Jiang

    Physics Div, Argonne National Lab, Argonne National Lab, Illinois 60439, USA

  • Yun Sun

    Hefei National Lab, Univ of Sci \& Tech of China, USTC, Hefei, China

  • K. Bailey

    Argonne National Laboratory, Physics Div, Argonne National Lab, Argonne National Lab, Illinois 60439, USA, Argonne National Lab

  • Andrew Davis

    Univ of Chicago, Univ of Chicago, USA

  • Shuiming Hu

    Hefei National Lab, Univ of Sci \& Tech of China, USTC, Hefei, China

  • Zheng-Tian Lu

    Physics Division, Argonne National Laboratory; The Department of Physics and Enrico Fermi Institute, The University of Chicago, Argonne National Laboratory, Physics Div, Argonne National Lab, Univ of Chicago, Argonne National Lab, Illinois 60439, USA

  • P. Mueller

    Argonne National Laboratory, Physics Div, Argonne National Lab, Argonne National Lab, Illinois 60439, USA, Argonne National Lab

  • T.P. O'Connor

    Argonne National Laboratory, Physics Div, Argonne National Lab, Argonne National Lab, Illinois 60439, USA, Argonne National Lab

  • Roland Purtschert

    Univ of Bern, Univ of Bern, Bern, Switzerland

  • Neil Sturchio

    Univ of Chicago, Univ of Illinois, Chicago, USA