An Atom Chip-Based BEC System Having High Resolution In-Trap Imaging and Dynamic Optical Projection Capability

We present an Rb87 BEC system based on a glass and silicon atom chip that enables high-resolution (NA $=$ 0.6) in-trap imaging of a hybrid magnetic and optical trap. Atoms can be condensed and tightly confined in a magnetic trap established with on-chip wires, while an optical projection system is used to impose optical potentials. The optical potentials are produced using blue-detuned light modulated by a two-dimensional acousto-optic deflector. The Fourier transform of the RF signals applied to the deflectors determines the projected optical pattern, and therefore the atoms can be subjected to a practically arbitrary two dimensional potential that has a separable Fourier transform. We have used both fluorescence and absorption techniques to image atoms. The system allows for in-trap dynamical studies, for example, observing trapped-gas behavior in response to thermal gradients and changing optical potentials. We have used this system to perform studies, described elsewhere, of an atomtronic battery and a matterwave transistor oscillator.