Rydberg-atom-based electric field sensing: continuous-frequency measurements of high-intensity microwave electric fields

ORAL

Abstract

In this talk I will describe recent work employing Rydberg electromagnetically induced transparency in atomic vapors for atom-based electric field measurements and sensing. This will focus on the demonstration of high-intensity microwave electric-field measurements exceeding 1~kV/m and strong-field measurement capability over a continuous microwave frequency range in the $K_a$-band, up to $\pm 1$~GHz detuned from the next relevant atomic transition (15\% band coverage). Time permitting, developments towards improved measurement sensitivity of weak fields, polarization-selectivity, as well as DC-field measurement applications will also be discussed.

Authors

  • David Anderson

    Rydberg Technologies LLC

  • Georg Raithel

    University of Michigan, Rydberg Technologies LLC, University of Michigan, Department of Physics, University of Michigan, Ann Arbor, MI 48105, Univ of Michigan - Ann Arbor

  • Eric Paradis

    Eastern Michigan University, Rydberg Technologies LLC

  • Matthew Simons

    National Institute of Standards and Technology

  • Christopher Holloway

    National Institute of Standards and Technology