Rydberg-atom-based electric field sensing: continuous-frequency measurements of high-intensity microwave electric fields
ORAL
Abstract
In this talk I will describe recent work employing Rydberg electromagnetically induced transparency in atomic vapors for atom-based electric field measurements and sensing. This will focus on the demonstration of high-intensity microwave electric-field measurements exceeding 1~kV/m and strong-field measurement capability over a continuous microwave frequency range in the $K_a$-band, up to $\pm 1$~GHz detuned from the next relevant atomic transition (15\% band coverage). Time permitting, developments towards improved measurement sensitivity of weak fields, polarization-selectivity, as well as DC-field measurement applications will also be discussed.
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Authors
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David Anderson
Rydberg Technologies LLC
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Georg Raithel
University of Michigan, Rydberg Technologies LLC, University of Michigan, Department of Physics, University of Michigan, Ann Arbor, MI 48105, Univ of Michigan - Ann Arbor
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Eric Paradis
Eastern Michigan University, Rydberg Technologies LLC
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Matthew Simons
National Institute of Standards and Technology
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Christopher Holloway
National Institute of Standards and Technology