Optically-detected spin polarization magnetometry in V<sub>Si&nbsp;</sub>vacancies of 4H-SiC

ORAL

Abstract

Hexagonal type silicon carbide (4H-SiC) an attractive material platform for high power, radiation robust electronics and electrically modulated photonics, because of its excellent electronic and optical properties, high-purity commercial wafers, and mature fabrication technology. We study the silicon vacancy (VSi) as a promising candidate to integrate room temperature quantum sensing within the 4H-SiC platform. We present updated ODSP (optically detected spin polarization) results and compare with ODMR (optically detected magnetic resonance) measurements to build a quantitative, experimentally informed model for the spin polarization dynamics of VSi.

Presenters

  • Kirsten Masselink

    • Georgia Tech Research Institute

Authors

  • Kirsten Masselink

    • Georgia Tech Research Institute
  • Robert Wyllie

    • Georgia Institute of Technology
  • Ali Adibi

    • Georgia Institute of Technology