Optically-detected spin polarization magnetometry in V<sub>Si </sub>vacancies of 4H-SiC
ORAL
Abstract
Hexagonal type silicon carbide (4H-SiC) an attractive material platform for high power, radiation robust electronics and electrically modulated photonics, because of its excellent electronic and optical properties, high-purity commercial wafers, and mature fabrication technology. We study the silicon vacancy (VSi) as a promising candidate to integrate room temperature quantum sensing within the 4H-SiC platform. We present updated ODSP (optically detected spin polarization) results and compare with ODMR (optically detected magnetic resonance) measurements to build a quantitative, experimentally informed model for the spin polarization dynamics of VSi.
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Presenters
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Kirsten Masselink
- Georgia Tech Research Institute