Advances in Rydberg Atom Metrology

ORAL · F07 · ID: 4167991





Presentations

  • ORAL

    Publication: [1] D. A. Anderson, R.E. Sapiro, L.F. Gonçalves, R. Cardman, and G. Raithel, Phys. Rev. Applied 17, 044020 (2022).

    Presenters

    • Teng Zhang

      • Rydberg Technologies Inc

    Authors

    • Teng Zhang

      • Rydberg Technologies Inc
    • Luis Felipe Goncalves

      • Rydberg Technologies Inc
    • Georg A Raithel

      • University of Michigan
    • David A Anderson

      • Rydberg Technologies Inc

    View abstract →

  • ORAL

    Publication: S. B. Oliver, S. Berweger, E. E. Mikhailov, D. Manchaiah, N. Prajapati, C. L. Holloway, and M. T. Simons, "Simultaneous Detection, Demodulation, and Angle-of-Arrival Determination of Communication Signals Using a Dual Ladder Rydberg Receiver," To be submitted

    Presenters

    • Stone Oliver

      • National Institute of Standards and Technology (NIST)

    Authors

    • Stone Oliver

      • National Institute of Standards and Technology (NIST)
    • Samuel Berweger

      • National Institute of Standards and Technology Boulder
    • Eugeniy Mikhailov

      • The College of William & Mary
      • College of William & Mary
    • Dixith Manchaiah

      • National Institute of Standards and Technology
      • National Institute of Standards and Technology(NIST)
    • Nikunjkumar Prajapati

      • National Institute of Standards and Technology Boulder
      • National Institute of Standards and Technology (NIST)
    • Christopher L Holloway

      • National Institute of Standards and Technology Boulder
    • Mathew T simons

      • National Institute of Standards and Technology (NIST)
      • NIST

    View abstract →

  • ORAL

    Publication: All-optical multiband quantum Rydberg radiometer (TBA)

    Presenters

    • Mateusz Mazelanik

      • University of Warsaw

    Authors

    • Mateusz Mazelanik

      • University of Warsaw
    • Marcin Jastrzębski

      • University of Warsaw
    • Sebastian Borówka

      • University of Warsaw
    • Gabriel Ko

      • University of Warsaw
    • Wiktor M Krokosz

      • Uniwersytet Warszawski
      • University of Warsaw
    • Wojciech Wasilewski

      • University of Warsaw
    • Michal Parniak

      • University of Warsaw

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  • ORAL

    Presenters

    • Luis Gustavo Marcassa

      • University of São Paulo

    Authors

    • Manuel A. A Lefran Torres

      • Sao Carlos Institute of Physics at the University of Sao Pau
    • Daniel V Magalhães

      • Universidade de São Paulo
    • Reginaldo D Napolitano

      • Sao Carlos Institute of Physics at the University of Sao Paulo
    • JORGE DOUGLAS M MASSAYUKI KONDO

      • University of Santa Catarina UFSC
    • Luis Gustavo Marcassa

      • University of São Paulo

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  • ORAL

    Publication: Duverger, R., Bonnin, A., Granier, R., Marolleau, Q., Blanchard, C., Zahzam, N., ... & Schwartz, S. (2024). Metrology of microwave fields based on trap-loss spectroscopy with cold Rydberg atoms. Physical Review Applied, 22(4), 044039..

    Presenters

    • Romain GRANIER

      • ONERA, THE FRENCH AEROSPACE LAB

    Authors

    • Romain GRANIER

      • ONERA, THE FRENCH AEROSPACE LAB
    • Alexis Bonnin

      • ONERA, THE FRENCH AEROSPACE LAB
    • Anthony El Bekai

      • ONERA, THE FRENCH AEROSPACE LAB
    • Miguel Cifuentes

      • ONERA, THE FRENCH AEROSPACE LAB
    • Sylvain Schwartz

      • ONERA, THE FRENCH AEROSPACE LAB

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  • ORAL

    Presenters

    • Qian Liang

      • Penn State University

    Authors

    • Qian Liang

      • Penn State University
    • Chenxi Huang

      • University of Illinois at Urbana-Champaign
    • Mingsheng Tian

      • Pennsylvania State University
    • Ruiyu Li

      • Penn State University
    • Ethan Springhorn

      • Pennsylvania State University
    • Matthew A Krebs

      • Pennsylvania State University
      • The Pennsylvania State University
    • Bryce Gadway

      • Pennsylvania State University

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  • ORAL

    Presenters

    • Dixith Manchaiah

      • National Institute of Standards and Technology
      • National Institute of Standards and Technology(NIST)

    Authors

    • Dixith Manchaiah

      • National Institute of Standards and Technology
      • National Institute of Standards and Technology(NIST)
    • William J Watterson

      • National Institute of Standards and Technology(NIST), Boulder
    • Christopher L Holloway

      • National Institute of Stands and Technology (NIST)
      • National Institute of Standards and Technology (NIST)

    View abstract →