Progress towards Doppler thermometry in microfabricated vapor cells

POSTER

Abstract

We report on our effort to develop Doppler thermometers using microfabricated atomic vapor cells. The Doppler broadening of spectral lines relates gas temperature to physical constants and immutable gas properties, enabling primary thermometry. We present measurements of the Doppler broadening in a microfabricated rubidium vapor cell from 25 °C to above 100 °C. The accuracy of the fitted Doppler temperature is limited by parasitic etalons in the vapor cell. To reduce the temperature uncertainty, we are implementing improved physical models of the etalon transmission. We also discuss prospects for improving the accuracy and increasing the operating temperature range of atomic Doppler thermometers using microfabricated cesium and ytterbium vapor cells.

Presenters

  • Ryan M Johnson

    • National Institute of Standards and Technology

Authors

  • Ryan M Johnson

    • National Institute of Standards and Technology

  • Yu-Ting Chen

    • National Institute of Standards and Technology

  • Sean M Bresler

    • National Institute of Standards and Technology

  • Erin M Adkins

    • National Institute of Standards and Technology

  • Matthew T Hummon

    • National Institute of Standards and Technology

  • Benjamin J Reschovsky

    • National Institute of Standards and Technology

  • Vladimir Aksyuk

    • National Institute of Standards and Technology

  • Stephen Eckel

    • National Institute of Standards and Technology (NIST)
    • National Institute of Standards and Technology

  • Tobias K Herman

    • National Institute of Standards and Technology

  • John E Kitching

    • National Institute of Standards and Technology
    • National Institute of Standards and Technology Boulder

  • Daniel S Barker

    • National Institute of Standards and Technology (NIST)
    • National Institute of Standards and Technology