Microfluidics Dynamics IX: Velocimetry

Presentations

• 3-D 3-C Layered Micro-PIV

  ORAL

  Nov. 21, 2006, 8:00 AM – Nov. 21, 2006, 8:13 AM

  Authors

  • Matthew Pommer

  • Andrew Kiehl

  • Carl Meinhart

    • UCSB Mechanical Engineering
    • University of California Santa Barbara
    • University of California, Santa Barbara

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• PIV Measurements of Slug Flow in a Square Microchannel

  ORAL

  Nov. 21, 2006, 8:13 AM – Nov. 21, 2006, 8:26 AM

  Authors

  • Bradford Bruno

  • Jason Rosen

    • Union College, Mechanical Engineering Department

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• Particle Motion under Shear-Induced Migration in Square-PDMS Microchannels

  ORAL

  Nov. 21, 2006, 8:26 AM – Nov. 21, 2006, 8:39 AM

  Authors

  • Young Won Kim

  • Jung Yul Yoo

    • Seoul National University

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• Three-component velocity measurement in a micro-scale three-dimensional flow environment using correlation tracking.

  ORAL

  Nov. 21, 2006, 8:39 AM – Nov. 21, 2006, 8:52 AM

  Authors

  • Nejdet Erkan

  • Kyosuke Shinohara

    • Dept. of Quantum Eng. and Systems Science, University of Tokyo

  • Koji Okamoto

    • Dept. of Environmental Studies, University of Tokyo
    • Department of Quantum Engineering and Systems Science, University of Tokyo

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• Two-Component Velocity Measurements of the Flow over a Backward Facing Step within a Microchannel using Molecular Tagging Velocimetry

  ORAL

  Nov. 21, 2006, 8:52 AM – Nov. 21, 2006, 9:05 AM

  Authors

  • Chee Lum

    • Michigan State University

  • Manoochehr Koochesfahani

    • Department of Mechanical Engineering, Michigan State University

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• The Structure of Transitional Wall-Bounded Microscale Flows

  ORAL

  Nov. 21, 2006, 9:05 AM – Nov. 21, 2006, 9:18 AM

  Authors

  • Vinay Natrajan

    • Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign

  • Kenneth Christensen

    • Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign

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• Statistical and Structural Features of Wall Turbulence at the Microscale

  ORAL

  Nov. 21, 2006, 9:18 AM – Nov. 21, 2006, 9:31 AM

  Authors

  • Kenneth Christensen

    • Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign

  • Vinay Natrajan

    • Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign

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• Measurement and Simulation of Hindered Diffusion and the Implications for Near-Wall Velocimetry

  ORAL

  Nov. 21, 2006, 9:31 AM – Nov. 21, 2006, 9:44 AM

  Authors

  • Peter Huang

    • Brown University

  • Kenneth Breuer

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• Label-free and real-time imaging of microscale mixture concentration fields using Surface Plasmon Resonance (SPR) reflectance

  ORAL

  Nov. 21, 2006, 9:44 AM – Nov. 21, 2006, 9:57 AM

  Authors

  • Kenneth D. Kihm

    • The University of Tennessee

  • Iltai Kim

    • University of Tennessee

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• Diffusion-Induced Bias in Near-Wall Velocimetry

  ORAL

  Nov. 21, 2006, 9:57 AM – Nov. 21, 2006, 10:10 AM

  Authors

  • Reza Sadr

    • Georgia Tech Savannah

  • Christel Hohenegger

    • University of North Carolina

  • Haifeng Li

    • Georgia Institute of Technology

  • Peter J. Mucha

    • University of North Carolina

  • Minami Yoda

    • Georgia Institute of Technology

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• Estimating the Slip Length using Single Quantum Dot (QD) Velocimetry

  ORAL

  Nov. 21, 2006, 10:10 AM – Nov. 21, 2006, 10:23 AM

  Authors

  • Shahram Pouya

  • Manoochehr Koochesfahani

    • Department of Mechanical Engineering, Michigan State University

  • Chee Lum

    • Michigan State University

  • Preston Snee

  • Moungi Bawendi

  • Daniel Nocera

    • Massachusetts Institute of Technology

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• Slip Lengths on Hydrophobic and Hydrophilic Surfaces Measured by Quantum Dots

  ORAL

  Nov. 21, 2006, 10:23 AM – Nov. 21, 2006, 10:36 AM

  Authors

  • Manoochehr Koochesfahani

    • Department of Mechanical Engineering, Michigan State University

  • Shahram Pouya

  • Chee Lum

    • Michigan State University

  • Preston Snee

  • Moungi Bawendi

  • Daniel Nocera

    • Massachusetts Institute of Technology

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