Modeling thin-film dynamics in multiscale volume-of-fluid simulations
ORAL
Abstract
In two-phase flow simulations utilizing the volume-of-fluid (VOF) method for interface capturing, the mesh size limits the characteristic length of the smallest resolvable features, which hinders the prediction of breakup. We present a computational framework to couple the VOF method to a thin-film model in underresolved fluid regions to accurately predict the thickness evolution of the film. A two-plane interface reconstruction in each cell and a connected-component labeling method for film identification facilitate a seamless transition between the VOF representation and the thin-film model. We demonstrate our method on a liquid sheet that thins down to subgrid scale due to flow kinematics and discuss implications for bag breakup modeling.
*This work was sponsored by the Office of Naval Research (ONR) as part of the Multidisciplinary University Research Initiatives (MURI) Program, under grant number N00014-16-1-2617. The views and conclusions contained herein are those of the authors only and should not be interpreted as representing those of ONR, the U.S. Navy, or the U.S. Government.
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Presenters
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Austin Han
- Cornell University