Complex Plasmas

ORAL · NO6 ·





Presentations

  • ORAL

    Authors

    • Iris Pilch

      • Institute for Experimental and Applied Physics, Christian-Albrechts University, D-24098 Kiel, Germany
    • Torben Reichstein

      • Institute for Experimental and Applied Physics, Christian-Albrechts University, D-24098 Kiel, Germany
    • Alexander Piel

      • IEAP CAU Kiel, Germany
      • IEAP CAU Kiel
      • Institute for Experimental and Applied Physics, Christian-Albrechts University, D-24098 Kiel, Germany

    View abstract →

  • ORAL

    Authors

    • John Goree

      • Univ. of Iowa
    • Bin Liu

      • Univ. of Iowa
    • V.E. Fortov

      • JIHT, Russian Acad. of Sciences, 125412 Moscow, Russia
    • A.M. Lipaev

      • JIHT, Russian Acad. of Sciences, 125412 Moscow, Russia
    • V.I. Molotkov

      • JIHT, Russian Acad. of Sciences, 125412 Moscow, Russia
    • O. Petrov

      • JIHT, Russian Acad. of Sciences, 125412 Moscow, Russia
    • G.E. Morfill

      • Max-Planck-Institut f\"ur Extraterrestrische Physik, Garching, Germany
    • H.M. Thomas

      • Max-Planck-Institut f\"ur Extraterrestrische Physik, Garching, Germany
    • R. Rothermel

      • Max-Planck-Institut f\"ur Extraterrestrische Physik, Garching, Germany
    • A. Ivlev

      • Max-Planck-Institut f\"ur Extraterrestrische Physik, Garching, Germany

    View abstract →

  • ORAL

    Authors

    • Victor Land

      • Center for Astrophysics, Space Physics and Engineering Research, Baylor University, Waco, TX 76798, USA
    • Diana Bolser

      • Participant in Baylor University's Summer Undergraduate Research Program
      • Participant in Baylor University's NSF Research Experience for Undergraduates Program
    • Lorin Matthews

    • Truell Hyde

    View abstract →

  • ORAL

    Authors

    • Jie Kong

      • CASPER - Baylor University
    • Truell Hyde

      • CASPER - Baylor University
    • Lorin Matthews

      • CASPER - Baylor University
    • Ke Qiao

      • CASPER-Baylor University
      • CASPER - Baylor University
    • Zhuanhao Zhang

      • CASPER-Baylor University
      • CASPER - Baylor University
    • Brandon Harris

      • CASPER-Baylor University
    • Gary Shetler

      • CASPER-Baylor University
    • Steve Rapp

      • CASPER-Baylor University
    • Jimmy Schmoke

      • CASPER-Baylor University
    • Mike Cook

      • CASPER - Baylor University
      • CASPER-Baylor University

    View abstract →

  • ORAL

    Authors

    • Ke Qiao

      • CASPER-Baylor University
      • CASPER - Baylor University
    • Truell Hyde

      • CASPER - Baylor University
    • Lorin Matthews

      • CASPER - Baylor University
    • Jie Kong

      • CASPER - Baylor University
    • Jorge Carmona Reyes

      • CASPER - Baylor University
    • Zhuanhao Zhang

      • CASPER-Baylor University
      • CASPER - Baylor University
    • Jimmy Schmoke

      • CASPER-Baylor University
    • Mike Cook

      • CASPER-Baylor University

    View abstract →

  • ORAL

    Authors

    • Zhuanhao Zhang

      • CASPER - Baylor University
    • Truell Hyde

      • CASPER - Baylor University
    • Lorin Matthews

      • CASPER - Baylor University
    • Jie Kong

      • CASPER - Baylor University
    • Jorge Carmona Reyes

      • CASPER - Baylor University
    • Ke Qiao

      • CASPER-Baylor University
      • CASPER - Baylor University
    • Jimmy Schmoke

      • CASPER-Baylor University
    • Mike Cook

      • CASPER-Baylor University

    View abstract →

  • ORAL

    Authors

    • Bernard Smith

      • CASPER - Baylor University
    • Truell Hyde

      • CASPER - Baylor University
    • Lorin Matthews

      • CASPER - Baylor University
    • Megan Johnson

      • CASPER - Baylor University
    • Mike Cook

      • CASPER - Baylor University
      • CASPER-Baylor University
    • Jimmy Schmoke

      • CASPER-Baylor University

    View abstract →

  • ORAL

    Authors

    • Toshiro Kaneko

      • Tohoku Univ.
      • Department of Electronic Engineering, Tohoku University
    • Takashi Harada

      • Department of Electronic Engineering, Tohoku University
    • Qiang Chen

      • Department of Electronic Engineering, Tohoku University
    • Rikizo Hatakeyama

      • Tohoku Univ.
      • Department of Electronic Engineering, Tohoku University

    View abstract →