SXR measurements of Resistive Wall Mode behavior in NSTX

POSTER

Abstract

A multi-energy soft X-ray (ME-SXR) array has been used for the determination of time and space-resolved emissivity profiles during stabilized resistive wall mode (RWM) experiments in NSTX. The main purpose of this study is to distinguish whether the changes on the plasma response ($T_{e}$, $n_{e}$, $n_{Z}$) correspond to the observation of a stabilized RWM or to the effect of the Resonant Field Amplification (RFA). Kinetic measurements of the RFA due to stable RWMs were tested using a single frequency $n=1$ traveling waveform in which the peak-to-peak amplitude was changed by an order of magnitude; neon injection was used to increase the signal-to-noise ratio of the ME-SXR diagnostic. The effect of the RFA on the kinetic profiles was observed and correlated with a suite of diagnostics including that of a toroidally displaced SXR array for $n=1$ RWM identification. This work was supported by the US DoE grant No. DE-FG02-99ER5452 at JHU and DoE-PPPL Contract No. DE-AC02-09CH11466.

Authors

  • L. Delgado-Aparicio

    • The Johns Hopkins University
    • JHU

  • K. Tritz

    • Johns Hopkins University
    • Johns Hopkins
    • The Johns Hopkins University
    • JHU

  • M. Finkenthal

  • D. Stutman

    • The Johns Hopkins University

  • S.A. Sabbagh

    • Columbia University
    • Columbia U.

  • John W. Berkery

    • Columbia University
    • Columbia U.

  • S.P. Gerhardt

    • PPPL
    • Princeton Plasma Physics Laboratory

  • R.E. Bell

    • PPPL
    • PPPL, Princeton, NJ
    • Princeton Plasma Physics Laboratory
    • PPPL, Princeton University, Princeton, NJ

  • B.P. LeBlanc

    • PPPL
    • PPPL, Princeton, NJ
    • Princeton Plasma Physics Laboratory

  • J. Manickam

    • Princeton Plasma Physics Laboratory

  • Jonathan Menard

    • Princeton Plasma Physics Laboratory
    • PPPL

  • Lane Roquemore

    • PPPL, Princeton, NJ
    • Princeton Plasma Physics Laboratory
    • PPPL
    • P.P.P.L.