Laser Cut X-pinches
POSTER
Abstract
We present experimental data from laser cut X-pinches in an effort to develop a reliable and efficient X-ray backlighting source for the characterization of ICF capsules. Temporal and spatial resolution of the pinch is resolved using wideband Si diodes and time integrated x-ray pinhole cameras respectively. A comparison is made between laser cut and traditionally arranged X- pinches in terms of X-ray emission intensity, point-source coherence, and reproducibility.