SXR to XUV imaging diagnostics for NSTX Upgrade

A suite of SXR to VUV imaging diagnostics for transport and MHD measurements in NSTX-Upgrade are being designed by the JHU group. Two toroidally displaced tangential multi-energy SXR arrays will image the edge and core plasma with 1 cm and 3 cm resolution respectively. The applications of the diagnostic will include perturbative impurity and electron transport, fast Te and nexnz profile measurements, and non-magnetic MHD mode identification. The system is complemented by a tangential Transmission Grating Imaging Spectrometer measuring the spatial distribution of XUV impurity emission from the edge to the core and by a repetitive laser-blow off system aimed at enabling multiple transport measurements during a discharge. For the divertor, we are designing a dual grating Imaging Radiometer for measurements of the radiated power in multiple SXR and VUV spectral bins with high space and time resolution. These measurements will assist the experimental and modeling studies planned for the NSTX-U divertor. Lastly, an ultrafast (4 MHz) dual-energy SXR imaging system is being designed for diagnostic of *AE modes and the associated Te, nexnz perturbations. Work supported by US DOE Grants DE-S0000787 and DE-FGO2-86ER53214.