The effect of impurities and incident angle on the secondary electron emission of Ni(110)

POSTER

Abstract

The investigation of secondary electron emission (SEE) of conducting materials used for magnetic fusion devices and plasma thrusters is important for determining device lifetime and performance. Methods to quantify the secondary electron emission from conducting materials and to characterize the effects that impurities and incident angles have on secondary electron emission were developed using 4-grid low energy electron diffraction (LEED) optics. The total secondary electron yield from a Ni(110) surface was continuously measured from the sample current as surface contamination increased from reactions with background gases in the ultrahigh vacuum chamber. Auger electron spectroscopy (AES) and temperature programmed desorption (TPD) were used to examine the composition and impurity levels on the Ni(110) surface. The total secondary electron yield was also measured at different incident angles.

*Thank you to the Princeton Plasma Physics Laboratory and the Department of Energy for the opportunity to work on this project through the Science Undergraduate Laboratory Internships.

Authors

  • Hadar Lazar

    • University of Chicago

  • Marlene Patino

    • University of California, Los Angeles

  • Yevgeny Raitses

    • Princeton Plasma Phys Lab
    • Princeton Plasma Physics Laboratory
    • Princeton Plasma Physics Laboratory, Princeton, New Jersey 08540, USA

  • Bruce E. Koel

    • Princeton University
    • Department of Chemical and Biological Engineering, Princeton University

  • Charles Gentile

    • Princeton Plasma Physics Laboratory

  • Eliot Feibush

    • Princeton Plasma Physics Laboratory