Hardware Upgrades for Microwave/Millimeter-Wave Diagnostics on LTX-β

Fluctuation measurements and their relation to transport will be of key interest in the LTX-β device, which will have higher B_T and I_P, and neutral beam heating. The microwave/millimeter-wave diagnostics on the device have been upgraded to enhance fluctuation measurements on the new machine. Faster data acquisition hardware with additional channels for the FM-CW (frequency-modulated continuous-wave) reflectometer (13.5-33 GHz) will increase the repetition rates to 200 kHz. New data acquisition hardware and a new detector for the 288 GHz interferometer will increase the S/N ratio as well as allow higher intermediate frequencies for robust tracking of the line density. New diagnostics include the two-channel tunable fixed-frequency quadrature reflectometer (13.5-20.5 and 27-40 GHz) and far-forward scattering (FFS) using the interferometer hardware. Optimization for FFS will require modifications to the interferometer beam transmission line. Future upgrade plans, as well as detailed descriptions and experimental data from the above diagnostics, will be presented.