Progress on a Laser Inverse Compton Scattering Runaway Electron Diagnostic Design for DIII-D

POSTER

Abstract

We report on progress in the design and component testing of a Laser Inverse Compton Scattering diagnostic (i) to measure runaway electrons in the range of 3-30 MeV in the DIII-D tokamak during triggered disruptions. An 80 picosecond, 2-3 Joule, rep-rated Nd:Yag laser is being developed at Voss Scientific. This short-pulse high energy laser is required due to the large background soft x-ray levels and low density of runaway electrons being diagnosed. A 4-channel gated soft x-ray imager (based on ones used at NIF) has been tested on the synchrotron Advanced Photon Source at Argonne National Laboratory. A synthetic diagnostic model is being developed at Woodruff Scientific to optimize design issues, with regards to geometry and choice of filters. Finally, a suitable (tentative) tangential port has been identified on the DIII-D tokamak, and a diagnostic design package is being completed. (i) G. A. Wurden, J. A. Oertel, T. E. Evans, Rev Sci. Instr. 85(11), 11E111, (2014)

*Supported by the US DOE Fusion Energy Sciences Advanced Diagnostics Program, and grants DE-SC0019078, DE-SC0019310, DE-SC0019196, and an SBIR Phase II.

Authors

  • Glen Wurden

    • Los Alamos National Laboratory
    • LANL

  • Thomas Archuleta

    • Los Alamos National Laboratory

  • Joshua Coleman

    • Los Alamos National Laboratory

  • John Oertel

    • Los Alamos National Laboratory

  • Zhehui Wang

    • Los Alamos National Lab
    • Los Alamos National Laboratory
    • Los Alamos National Laboratory (LANL)

  • Thomas Weber

    • Los Alamos National Laboratory

  • T.E. Evans

    • General Atomics
    • GA
    • General Atomics, San Diego, CA

  • Simon Woodruff

    • Woodruff Scientific

  • Paul Sieck

    • Woodruff Scientific

  • Eric Hollmann

    • University of California, San Diego
    • UCSD

  • Dustin Offermann

    • Voss Scientific