Time resolved measurement of electron density and temperature in NIF compressed capsules with the dHIRES x-ray spectrometer
POSTER
Abstract
The dHIRES x-ray spectrometer has been used to measure time resolved electron temperature (Te) and density (ne) in the hot spot of four NIF compressed capsules at stagnation from high resolution Kr helium-β x-ray spectra. The inferred, time averaged ne values mainly agree with ne values from neutron diagnostics within uncertainties, but neutron time of flight values of Tion are consistently higher than dHIRES Te values by 200 – 700 eV. The dHIRES measurements and measurement technique, uncertainty analysis, and discussion of comparisons with measurements with neutron diagnostics will be presented.
*Work performed under the auspices of the U.S. Department of Energy by Princeton Plasma Physics Laboratory under contract DE-AC02-09CH11466 and by Lawrence Livermore National Laboratory under contract DE-AC52-07NA27344
Presenters
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Kenneth W Hill
- Princeton University
- Princeton Plasma Physics Laboratory