Monochromatic Talbot-Lau X-ray Imaging Diagnostics
ORAL
Abstract
Talbot-Lau X-ray Interferometry is a refraction-based imaging technique that can characterize high electron density gradients in High Energy Density (HED) experiments through phase-contrast methods. In the Talbot-Lau X-ray Deflectometry (TXD) mode, the diagnostic delivers simultaneous attenuation, dark-field, and phase-change measurements from a single Moiré image. TXD diagnostic platforms have been deployed at the Multi-TeraWatt and Omega EP lasers using laser-produced x-ray backlighters. To further improve diagnostic performance and data accuracy, monochromatic TXD has been established using 8 keV multilayer mirrors. Copper foil and wire targets were irradiated at 1014-15 W/cm2, exploring the effect of laser pulse length (~10-80 ps) and backlighter target configuration on spatial resolution and Moiré fringe contrast. Copper foils irradiated at 80° delivered <6 µm spatial resolution with increased fringe contrast (>30%) in comparison with previous results using standard TXD diagnostics (11-24%). Additionally, advanced data post-processing tools have been developed to enhance TXD diagnostic capabilities. Instrumental and experimental limitations for monochromatic TXD diagnostics in the laser environment will be presented and discussed.
*This work was supported by the NNSA HEDLP Grant Nos. DE-NA0003882 and DE-NA0004028
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Presenters
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Maria Pia Valdivia Leiva
- University of California, San Diego
- Center for Energy Research, University of California San Diego, San Diego, California, USA
- University of California San Diego