Excessive electron emission from a velvet cathode
ORAL
Abstract
The Cathode Test Stand (CTS) at LANL is utilized to test velvet cathodes on microsecond timescales. At this pulse duration, velvet provides interesting results that are not fully documented or diagnosed. The CTS employs various diagnostics to measure voltage, extracted current, current density, and electron and x-ray scatter. Diagnostics show stochastic instances where the extracted current exceeds the space charge limit. Diamond Radiation Detectors (DRDs) and an ICCD are deployed to monitor excess electron emission and increased light signal on the cathode face. Here we will show correlations between these measurements,.
*Work supported by Triad National Security, LLC for the National Nuclear Security Administration of U.S. Department of Energy under contract 89233218CNA000001. Work also supported by the US Department of Energy, Office of Science, High Energy Physics under Cooperative Agreement award number DE-SC0018362 and Michigan State University.
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Presenters
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Madison R Howard
- Michigan State University and Los Alamos National Laboratory