MFE Tutorial: Bayesian Analysis

INVITED · UT02 · ID: 1735219

Presentations

  • ORAL · Invited

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    Publication: Leddy, J., Madireddy, S., Howell, E., & Kruger, S. (2022). Single Gaussian process method for arbitrary tokamak regimes with a statistical analysis. Plasma Physics and Controlled Fusion, 64(10), 104005.

    Leddy, J., et.al. (2023). A Statistical Analysis of Applying Gaussian Process Regression to Thomson Scattering Data on the DIII-D Tokamak to be published

    Presenters

    • Scott E Kruger

      • Tech-X Corp
      • Tech-X

    Authors

    • Scott E Kruger

      • Tech-X Corp
      • Tech-X

    • Jarrod Leddy

      • Tech-X Corp
      • Tech-X Corporation

    • Eric C Howell

      • Tech-X Corp

    • Sandeep Madireddy

      • Argonne National Laboratory

    • Lang L Lao

      • General Atomics

    • Cihan Akcay

      • General Atomics

    • Torrin A Bechtel

      • Oakridge Associate Universities
      • General Atomics

    • Joseph T McClenaghan

      • General Atomics - San Diego
      • General Atomics

    • David Orozco

      • General Atomics

    • Sterling P Smith

      • General Atomics

    • Xuan Sun

      • General Atomics
      • Oakridge Associated Universities

    • Samuel W Williams

      • Lawrence Berkeley National Laboratory

    • Oscar Antepara

      • Lawrence Berkeley National Laboratory

    View abstract →