Impact of Self-Generated Magnetic Fields on Hot Electron Transport in Hohlraums

ORAL

Abstract

In Inertial Confinement Fusion (ICF) experiments, high laser intensities drive multiple types of instabilities capable of accelerating electrons to supra-thermal velocities. These hot electrons are especially prevalent in hohlraums, where the high intensities at the Laser Entrance Hole (LEH) can couple very effectively to hot electrons and cause deleterious preheat of the implosion. Past work has shown that the directionality of these hot electrons is influenced by the fill density of the hohlraum, but has only considered ballistic hot electron trajectories in the interpretation. However, as the Biermann Battery mechanism is expected to result in magnetic fields of ~200 kG at the LEH, strong enough to significantly confine hot electrons, the assumption of ballistic hot electron trajectories is most likely incorrect. In this work, a suite of 2D MHD hohlraum simulations are used to determine the impact of these self-generated fields on hot electron transport. It is shown that low fill hohlraums exhibit a severa-fold increase in the fraction of hot electrons hitting the implosion vs hitting the hohlraum wall when the fill pressure is lowered, in line with past experimental results obtained using x-ray imaging

*This work was supported by DOE/NNSA contract DE-NA0003868; B. Reichelt is supported by NNSA SSGF DE-NA0003960

Publication: Planned submission to PRL

Presenters

  • Benjamin Reichelt

    • Massachusetts Institute of Technology

Authors

  • Benjamin Reichelt

    • Massachusetts Institute of Technology
  • Graeme D Sutcliffe

    • Lawrence Livermore National Laboratory
    • Massachusetts Institute of Technology
  • Jacob A Pearcy

    • Massachusetts Institute of Technology
  • Eduard L. Dewald

    • Lawrence Livermore Natl Lab
  • Otto L Landen

    • Lawrence Livermore National Laboratory
  • Matthias Hohenberger

    • Lawrence Livermore Natl Lab
  • Sean P Regan

    • Laboratory for Laser Energetics, University of Rochester
  • Richard David Petrasso

    • Massachusetts Institute of Technology MIT
  • Chikang Li

    • Massachusetts Institute of Technology MIT