An Improved and Substantially Faster System for Scanning CR-39 Detectors Used in Charged-Particle and Neutron Diagnostics on OMEGA, the NIF and Z

POSTER

Abstract

CR-39 is a passive charged-particle detector widely used in diagnostics for experiments at OMEGA, the NIF, and Z. Automated microscope scanning systems are used to scan the surface of CR-39 to analyze particle types and energies, but current systems can take up to 16 hours to scan one piece of CR-39. A new microscope scanning system is being developed, featuring a modern sCMOS camera with a much wider field of view, a piezoelectric focusing system, and optimized control software. This upgraded system was demonstrated to be able to scan samples up to sixteen times faster than current systems under ideal conditions. The new camera also has a higher spatial resolution, improving the precision and accuracy of particle measurements.

*This work is supported in part by the DOE/NNSA Center of Excellence, LLE, and LLNL.

Presenters

  • Ian T Rudnick

    • MIT Plasma Science and Fusion Center

Authors

  • Ian T Rudnick

    • MIT Plasma Science and Fusion Center

  • Fredrick H Seguin

    • Massachusetts Institute of Technology

  • Ernie Doeg

    • MIT Plasma Science and Fusion Center

  • Robert Frankel

    • MIT Plasma Science and Fusion Center

  • Melody Scott

    • LLE

  • Hannah McClow

    • University of Rochester

  • Peter V Heuer

    • University of Rochester
    • Laboratory for Laser Energetics (LLE)

  • Skylar G Dannhoff

    • Massachusetts Institute of Technology

  • Tucker E Evans

    • Massachusetts Institute of Technology

  • Justin H Kunimune

    • Massachusetts Institute of Technology

  • Yousef Lawrence

    • Massachusetts Institute of Technology

  • Lulu Russell

    • MIT Plasma Science and Fusion Center

  • Christopher W Wink

    • Massachusetts Institute of Technology

  • Johan A Frenje

    • Massachusetts Institute of Technology
    • MIT Plasma Science and Fusion Center