Assembling and Characterizing an Ultrahigh Vacuum Atomic Force Microscope

In an effort to image individual molecules on metal surfaces, three components of atomic force microscopes were investigated: a force probe, a sharp tip for scanning, and a mechanism for approaching the sample from distances greater than one micrometer. This project works on implementing these three features and characterizing them in air and in vacuum. Different electrochemical etching methods were performed, and a method was found to make acceptable tips for performing scans of molecules on metal surfaces. Properties of quartz tuning forks including resonant frequency and quality-factor were characterized under vacuum and air conditions as well as with and without sharp tips attached: both of these conditions affect the properties of the tuning forks. Different approach methods were tested to ensure that the tip would be able to walk consistently toward and away from the sample. Together these results can inform design choices for building atomic force microscopes.