Process Diagnostics and Monitoring Using the Multipole Resonance Probe (MRP)
POSTER
Abstract
In this contribution we present the application of the MRP in an industrial plasma ion assisted deposition (PIAD) chamber (Leybold optics SYRUS-pro). The MRP is a novel plasma diagnostic which is suitable for an industrial environment - which means that the proposed method is robust, calibration free, and economical, and can be used for ideal and reactive plasmas alike [1]. In order to employ the MRP as \emph{process diagnostics} we mounted the probe on a manipulator to obtain spatially resolved information on the electron density and temperature. As \emph{monitoring tool} the MRP is installed at a fixed position. Even during the deposition process it provides stable measurement results while other diagnostic methods, e.g. the Langmuir probe, may suffer from dielectric coatings.\\[4pt] [1] Lapke et. al., Appl. Phys. Lett. {\bf 93}, 051502 (2008)
Authors
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J. Harhausen
Leibniz Institute for Plasma Science and Technology
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P. Awakowicz
Ruhr-Universit\"at Bochum
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Ralf Peter Brinkmann
RUB, Ruhr-University Bochum, Ruhr-Universit\"at Bochum, Ruhr University
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R. Foest
Leibniz Institute for Plasma Science and Technology
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M. Lapke
Ruhr-Universit\"at Bochum
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T. Musch
Ruhr-Universit\"at Bochum
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T. Mussenbrock
Ruhr-Universit\"at Bochum
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Jens Oberrath
Ruhr-Universit\"at Bochum, Theoretical Electrical Engineering, Ruhr University Bochum
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A. Ohl
Leibniz Institute for Plasma Science and Technology
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I. Rolfes
Ruhr-Universit\"at Bochum
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Ch. Schulz
Ruhr-Universit\"at Bochum
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R. Storch
Ruhr-Universit\"at Bochum
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T. Styrnoll
Ruhr-Universit\"at Bochum