Process Diagnostics and Monitoring Using the Multipole Resonance Probe (MRP)

POSTER

Abstract

In this contribution we present the application of the MRP in an industrial plasma ion assisted deposition (PIAD) chamber (Leybold optics SYRUS-pro). The MRP is a novel plasma diagnostic which is suitable for an industrial environment - which means that the proposed method is robust, calibration free, and economical, and can be used for ideal and reactive plasmas alike [1]. In order to employ the MRP as \emph{process diagnostics} we mounted the probe on a manipulator to obtain spatially resolved information on the electron density and temperature. As \emph{monitoring tool} the MRP is installed at a fixed position. Even during the deposition process it provides stable measurement results while other diagnostic methods, e.g. the Langmuir probe, may suffer from dielectric coatings.\\[4pt] [1] Lapke et. al., Appl. Phys. Lett. {\bf 93}, 051502 (2008)

Authors

  • J. Harhausen

    Leibniz Institute for Plasma Science and Technology

  • P. Awakowicz

    Ruhr-Universit\"at Bochum

  • Ralf Peter Brinkmann

    RUB, Ruhr-University Bochum, Ruhr-Universit\"at Bochum, Ruhr University

  • R. Foest

    Leibniz Institute for Plasma Science and Technology

  • M. Lapke

    Ruhr-Universit\"at Bochum

  • T. Musch

    Ruhr-Universit\"at Bochum

  • T. Mussenbrock

    Ruhr-Universit\"at Bochum

  • Jens Oberrath

    Ruhr-Universit\"at Bochum, Theoretical Electrical Engineering, Ruhr University Bochum

  • A. Ohl

    Leibniz Institute for Plasma Science and Technology

  • I. Rolfes

    Ruhr-Universit\"at Bochum

  • Ch. Schulz

    Ruhr-Universit\"at Bochum

  • R. Storch

    Ruhr-Universit\"at Bochum

  • T. Styrnoll

    Ruhr-Universit\"at Bochum