Atomic and Molecular Scattering Data for Plasma and Related Applications Workshop II

Presentations

• Atomic Data Quality and Needs for Collisional-Radiative Modeling

  COFFEE_KLATCH · Invited

  Oct. 15, 2015, 2:00 AM – Oct. 15, 2015, 2:30 AM

  Authors

  • Yuri Ralchenko

    National Institute of Standards and Technology, NIST

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• Charge exchange spectroscopy of multiply charged ions for the development of the EUV light source for the next generation photo lithography

  COFFEE_KLATCH · Invited

  Oct. 15, 2015, 2:30 AM – Oct. 15, 2015, 3:00 AM

  Authors

  • Hajime Tanuma

    Department of Physics, Tokyo Metropolitan University

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• Interactions of Deuterium Plasma with Lithiated and Boronized Surfaces in NSTX-U

  COFFEE_KLATCH · Invited

  Oct. 15, 2015, 3:00 AM – Oct. 15, 2015, 3:30 AM

  Authors

  • Predrag Krstic

    State University of New York - Stony Brook

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