Development of microwave plasma diagnostics for various plasma devices
POSTER
Abstract
The author has developed a number of microwave and millimeter-wave plasma measurement devices, and is promoting their use in the various fields mentioned above. For example, microwave reflectometer and interferometer can measure electron density profile and fluctuation, electron cyclotron emission diagnostics can measure electron temperature and fluctuations. We have developed an extremely easy-to-use transmitter and receiver system using superheterodyne and frequency multiplication techniques, and applied them to many plasma device such as tokamak and helical plasma devices, linear plasma devices, Hall thrusters and RF plasma thrusters.
In this presentation, these microwave devices and its applications will be shown.
*This work was supported by JSPS KAKENHI Grant Number JP18H03815, JP22H00243, JP22H00117, and NIFS collaboration research program (NIFS22KIIP012, NIFS21KUHL103, NIFS20KUGM157.
Publication: [1] D. Kuwahara et al., Rev. Sci. Instrum. 85, 11D805 (2014).
[2] D. Kuwahara et al., J. Instrum. 10, C12031 (2015).
[3] Y. Wang et al., Nucl. Fusion 57, 072007 (2017).
[4] Y. Nagayama et al., Rev. Sci. Instrum. 88, 044703 (2017).
[5] A. Mase et al., Adv. Phys. X 3, 1472529 (2018).
[6] H. Tsuchiya et al., Plasma Fusion Res. 13, 3402063 (2018).
[7] M. Yoshikawa et al., J. Instrum. 14, P06033 (2019).
[8] N. Kuwabara et al., J. Propul. Power 37, 491 (2021).
[9] S. Naito et al., Nucl. Fusion 61, 116035 (2021).
[10] Y. Goto et al., J. Instrum. 17, C01016 (2022).
Presenters
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Daisuke Kuwahara
- Chubu University