Plasma Etching II
FOCUS · ER2 · ID: 2480686
Presentations
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Computational characterization of the area asymmetry effect in capacitively coupled plasmas
ORAL
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Presenters
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Saurav Gautam
Lam Research Corporation
Authors
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Saurav Gautam
Lam Research Corporation
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Saravanapriyan Sriraman
Lam Research, Lam Research Corporation
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Unintended Gas Discharges in Plasma Sources for Semiconductor Fabrication
ORAL
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Publication: Appl. Phys. Lett. 123, 232108 (2023)
Presenters
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Sunghyun Son
Princeton University
Authors
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Sunghyun Son
Princeton University
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Geunwoo Go
Seoul National University
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Willca Villafana
Princeton Plasma Physics Laboratory
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Igor D Kaganovich
Princeton Plasma Physics Laboratory
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Alexander V. Khrabrov
Princeton Plasma Physics Laboratory
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Hyo-Chang Lee
Korea Aerospace University
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Gwang-Seok Chae
Korea Aerospace University
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SeungBo Shim
Samsung Electronics Co. Ltd
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Donghyeon Na
Samsung Electronics Co. Ltd
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June Young Kim
Korea University
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Development of Machine Learning Potentials for Plasma-Surface Interactions
ORAL
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Presenters
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Andreas Kounis-Melas
Princeton University
Authors
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Andreas Kounis-Melas
Princeton University
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Joseph R Vella
Princeton Plasma Physics Laboratory
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Athanassios Z Panagiotopoulos
Princeton University
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David Barry Graves
Chemical & Biological Engineering Princeton University, Princeton University
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Role of secondary electrons in high power dual frequency capacitively coupled plasmas
ORAL
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Publication: [1] A V Phelps and Z Lj Petrovic 1999 Plasma Sources Sci. Technol. 8 R21
Presenters
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Sanjana Kerketta
Lam Research
Authors
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Sanjana Kerketta
Lam Research
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Chenhui Qu
Lam Research, Lam research
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Saurav Gautam
Lam research
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Rohini Mishra
Lam research
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Anamika Chowdhury
Lam research
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Saravanapriyan Sriraman
Lam Research, Lam Research Corporation
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Reaction mechanisms of ruthenium (Ru) etching by energetic oxygen and chlorine ions
ORAL
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Publication: [1] C. C. Hsu, J. W. Coburn, D. B. Graves, "Etching of ruthenium coating in O2- and Cl2- containing plasmas", Journal of Vacuum Science and Technology, A, Vol. 24 (2006), pp. 1-8
[2] K. Karahashi, and S. Hamaguchi, J. Phys. D: Appl. Phys. 47, 224008(2014)Presenters
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Takuma Yanagisawa
Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University
Authors
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Takuma Yanagisawa
Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University
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Tomoko Ito
Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University
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Masaya Imai
R&D Group, Hitachi, Ltd.,
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Katsuya Miura
R&D Group, Hitachi, Ltd.,
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Miyako Matsui
R&D Group, Hitachi, Ltd.,
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Kazuhiro Karahashi
Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University
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Satoshi Hamaguchi
Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University, Osaka University
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Formation of Ammonium Fluorosilicate during CH<sub>2</sub>F<sub>2</sub> Plasma Etching of SiN<sub>x</sub>
ORAL
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Presenters
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Xue Wang
Colorado School of Mines
Authors
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Xue Wang
Colorado School of Mines
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Prabhat Kumar
Lam Research Corporation
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Thorsten Lill
Lam Research Corporation
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Harmeet Singh
Lam Research, Lam Research Corporation
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Mingmei Wang
Lam Research Corporation
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Taner Ozel
Lam Research Corporation
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Sumit Agarwal
Colorado School of Mines
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Challenges in Semiconductor Etch Development and Opportunities for Plasma Modeling: An Industrial Perspective
ORAL · Invited
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Presenters
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Pingshan Luan
TEL Technology Center, America, LLC, University of Maryland College Park, TEL Technology Center America
Authors
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Pingshan Luan
TEL Technology Center, America, LLC, University of Maryland College Park, TEL Technology Center America
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