Study of an electron beam deflection with channeling in silicon crystals

Crystal channeling is a promising way to deflect high energy particles. As the basis for future applications of crystal channeling for a beam-handling system, such as a beam-splitting system at J-PARC and a collimator at the International Linear Collider, electron-beam deflection with silicon crystals has been studied. A 150-MeV electron beam from the REFER electron ring at Hiroshima University was incident on a silicon crystal (16 $\mu$m). The profile of the beam after passing through the crystal was measured by an image intensifier at 2.34-m downstream of the crystal. If channeling occurs, the profile will change as the angle of the crystal changes. In this talk, results of the experiments are presented, as well as a comoparison with a simulation and future prospects.