MeV Ion Beam Synthesis of Nanopore Arrays in SiO2 Films
ORAL
Abstract
High energy (MeV), heavy ion irradiation can be used as a tool to deform patterned SiO$_{2}$ films in a controlled fashion. We have used this technique to deform micron-sized holes in SiO$_{2}$ films generated by photolithography and focused ion beam milling. The holes were fabricated in 2 $\mu $m thick SiO$_{2}$ films in the size range from 500 nm to 2 $\mu $m and were subsequently irradiated with 4 MeV Xe$^{ }$ions. First, a systematic study will be presented on the deformation of differently shaped holes as a function of the ion fluence. Second, we will present data on the deformation of linear and two-dimensional arrays of holes. Finally, we will test the observed deformations against currently available visco-elastic models that describe this ion irradiation-induced deformation process. This work may find application in nanoscale fashioning of SiO$_{2}$ surface features and the controlled fabrication of nanopore arrays.
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Authors
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Andrew Carlson
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Anuranjita Tewary
Geballe Laboratory for Advanced Materials, Stanford University
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Mark Brongersma
Geballe Laboratory for Advanced Materials, Stanford University, Stanford University
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Thomas Felter
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Sergei Kucheyev
Lawrence-Livermore Labs