Scanned-gate and Kelvin-probe microscopy to investigate surface-acoustic-wave-driven transport through a depleted GaAs channel
ORAL
Abstract
Electron transport driven by a surface acoustic wave (SAW) through a depleted GaAs channel is the basis for a proposed device capable of quantum information transfer or processing. Device fabrication benefits from a detailed understanding of the capture process at the channel entrance and the dynamics in the channel. We report two experiments to obtain spatial information uniquely provided by low-temperature scanning-probe microscopy. Scanned-gate microscopy, which generates images of SAW-induced current, shows features near the channel entrance that evolve from spots to crescents. Comparison with simulations confirms that the SAW current increases when the maximum potential gradient along the channel is reduced. Kelvin-probe microscopy is adapted to make images of SAW-induced charge, revealing a build-up of negative charge at the channel entrance when no SAW current flows, and a broken line of negative charge, and occasionally positive charge or dipole behavior, with a SAW current.
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Authors
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Rolf Crook
University of Cambridge, UK
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Robert Schneble
University of Cambridge, University of Cambridge, UK
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Harvey Beere
University of Cambridge, UK
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David Ritchie
University of Cambridge, University of Cambridge, UK
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David Anderson
University of Cambridge, University of Cambridge, UK
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Geb Jones
University of Cambridge, University of Cambridge, UK
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Charles Smith
University of Cambridge, UK
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Chris Ford
University of Cambridge, University of Cambridge, UK
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Crispin Barnes
University of Cambridge, University of Cambridge, UK