Focus Session: Advances in Scanned Probe Microscopy II: Force Methods
FOCUS · H36 ·
Presentations
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Multi-dimensional Scanning Probe Microscopy
COFFEE_KLATCH · Invited
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Authors
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Hans J. Hug
- Empa, Materials Science and Technology, CH-8600 Duebendorf, Switzerland and Institute of Physics, University of Basel, CH-4056 Basel, Switzerland
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A Low Temperature Scanning Force Microscope with a Vertical Cantilever and Interferometric Detection Scheme
ORAL
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Authors
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Jeehoon Kim
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T.L. Williams
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Sang Lin Chu
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Hasan Korre
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Max Chalfin
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J.E. Hoffman
- Harvard University
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New Interpretation of Non-contact Atomic Force Microscopy Images of Dihydride Si(001) Surface Based on Simulation
ORAL
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Authors
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Akira Masago
- The University of Tokyo
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Satoshi Watanabe
- The University of Tokyo
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Katsunori Tagami
- Waseda University
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Masaru Tsukada
- Waseda University
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Real-time detection and reduction of probe-loss in atomic force microscopy
ORAL
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Authors
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Pranav Agarwal
- University of Minnesota, twin cities
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Tathagata De
- Iowa State University, AMES
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Murti Salapaka
- University of Minnesota, twin cities
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Evaluation of sensitivity and selectivity of piezoresistive cantilever-array sensors
ORAL
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Authors
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Genki Yoshikawa
- NCCR, University of Basel; IMR, Tohoku University
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Hans-Peter Lang
- NCCR, University of Basel
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Urs Staufer
- IMT, University of Neuchatel
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Peter Vettiger
- IMT, University of Neuchatel
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Toshio Sakurai
- IMR, Tohoku University
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Christoph Gerber
- NCCR, Tohoku University
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Observation of locally excited ferromagnetic resonance via magnetic resonance force microscopy
ORAL
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Authors
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Evgueni Nazaretski
- Los Alamos National Laboratory
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Denis Pelekhov
- Ohio State University
- The Ohio State University
- Physics Department, Ohio State University
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Ivar Martin
- LANL
- Los Alamos National Laboratory
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Peter C. Hammel
- The Ohio State University
- Physics Department, Ohio State University
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Roman Movshovich
- MPA-10, LANL, Los Alamos, NM, USA
- Los Alamos National Laboratory
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Characterization of the High Coercivity Magnetic Probe Tips for Magnetic Resonance Force Microscopy
ORAL
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Authors
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I.H. Lee
- The Ohio State University
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J. Kim
- The Ohio State University
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Yu Obukhov
- The Ohio State University
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P. Banerjee
- The Ohio State University
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Denis Pelekhov
- Ohio State University
- The Ohio State University
- Physics Department, Ohio State University
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Peter C. Hammel
- The Ohio State University
- Physics Department, Ohio State University
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Fabrication Challenges in Producing Magnet-tipped Cantilevers for Magnetic Resonance Force Microscopy
ORAL
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Authors
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Steven A. Hickman
- Dept of Chemistry
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Sean R. Garner
- Dept of Physics Cornell University
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Lee E. Harrell
- Dept of Physics USMA
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Jeremy C. Ong
- Dept of Chemistry Cornell University
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Seppe Kuehn
- Dept of Chemistry Cornell University
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John A. Marohn
- Dept of Chemistry Cornell University
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Fabricating overhanging magnets for use in magnetic resonance force microscopy using a XeF2 isotropic etch.
ORAL
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Authors
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Sarah Wright
- Cornell Department of Chemistry and Chemical Biology
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Steven Hickman
- Cornell University
- Cornell Department of Chemistry and Chemical Biology
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John Marohn
- Cornell University
- Cornell Department of Chemistry and Chemical Biology
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Bimodal AFM imaging of individual protein molecules with sub-pico Newton force sensitivity.
ORAL
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Authors
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Nicolas F. Martinez
- Instituto de Microelectronica de Madrid, CSIC
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Shiva Patil
- Instituto de Microelectronica de Madrid, CSIC
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Jose R. Lozano
- Instituto de Microelectronica de Madrid, CSIC
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Ricardo Garcia
- Instituto de Microelectronica de Madrid, CSIC
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Rheological Measurements by AFM of the Formation of Polymer Nanofibers
ORAL
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Authors
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Mehdi Yazdanpanah
- ElectroOptics Research Institute and Nanotechnology Center University of Louisville
- electroOptics Research Institute and Nanotechnology Center University of Louisville
- University of Louisville
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Mahdi Hosseini
- electroOptics Research Institute and Nanotechnology Center University of Louisville
- University of Louisville
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Santosh Pabba
- electroOptics Research Institute and Nanotechnology Center University of Louisville
- University of Louisville
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Scott Berry
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Vladimir Dobrokhotov
- ElectroOptics Research Institute and Nanotechnology Center University of Louisville
- electroOptics Research Institute and Nanotechnology Center University of Louisville
- University of Louisville
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Abdelilah Safir
- electroOptics Research Institute and Nanotechnology Center University of Louisville
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Robert Keynton
- electroOptics Research Institute and Nanotechnology Center University of Louisville
- University of Louisville
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Robert Cohn
- electroOptics Research Institute and Nanotechnology Center University of Louisville
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Micromechanical force detectors for measuring magnetization at high magnetic fields and the magnetic~ response of Ba3Cr2O8.
ORAL
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Authors
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K. Ninios
- UF
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Younjung Jo
- National High Magnetic Field Lab, Florida State University, Tallahassee, FL 32310
- NHMFL
- National High Magnetic Field Laboratory
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Luis Balicas
- National High Magnetic Field Lab, Florida State University, Tallahassee, FL 32310
- NHMFL-Tallahassee
- NHMFL
- National High Magnetic Field Laboratory
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A. Aczel
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G. M. Luke
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Ho Bun Chan
- University of Florida
- UF
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