Study on the electro-optic effect in Pb(Zr,Ti)O$_{3}$ (001) film using spectroscopic ellipsometry

ORAL

Abstract

Spectroscopic ellipsometry was applied to study electro-optic effect in lead zirconate titanate$^{ }$(PZT) thin films grown epitaxially on Nb-doped SrTiO$_{3}$(001) substrates by$^{ }$RF magnetron sputtering. Multilayer model analysis was applied$^{ }$to extract the ordinary and extraordinary refractive indices of the PZT thin film with electric$^{ }$field applied along the (001) direction. The effective linear and$^{ }$quadratic coefficients at a wavelength of 632.8 nm were estimated to be -134.6$\times $10$^{-12}$~m/V and 8.5$\times $10$^{-18}$~m$^{2}$/V$^{2}$, respectively, while the individual linear electro-optic$^{ }$coefficients $r_{33}$ and $r_{13}$ were -157.1 and 22 pm/V, respectively. We attributed existence of the linear electro-optic effect in unpoled PZT$^{ }$films to the presence of a built-in polarization$^{ }$and simultaneous poling during ellipsometric measurements.

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Authors

  • Tae Dong Kang

    Department of Physics, New Jersey Institute of Technology

  • Xiao Bo

    Department of Electrical and Computer Engineering, Virginia Commonwealth University

  • Vitaliy Avrutin

    Department of Electrical and Computer Engineering, Virginia Commonwealth University

  • \"Umit \"Ozg\"ur

    Department of Electrical and Computer Engineering, Virginia Commonwealth University

  • Hadis Morko\c{c}

    Department of Electrical and Computer Engineering, Virginia Commonwealth University

  • Jun Woo Park

    Kyung Hee University, Department of Physics, Kyung Hee University, South Korea

  • Ho Suk Lee

    Department of Physics, Kyung Hee University, South Korea

  • Hosun Lee

    Dept. of Applied Physics, Kyung Hee University, Suwon 446-701, South Korea, Kyung Hee University, Department of Physics, Kyung Hee University, South Korea

  • Xiaoyu Wang

    Department of Physics, Arizona State University

  • David Smith

    Department of Physics, Arizona State University