Electronic transport properties of graphene irradiated by charged particles

ORAL

Abstract

We have measured the effect of low energy charged particle irradiation (electrons, He ions, Ne ions or Ar ions) on the electronic transport properties of clean graphene devices on SiO$_{2}$. Charged particle irradiation induces additional scattering which is consistent with adding both short-ranged (i.e. point defect) and long-ranged (i.e. charged) impurities to the device. We also performed temperature-dependent conductivity of the irradiated devices from 9K to 400K in ultra high vacuum. In sharp contrast to graphene with charged impurity disorder, which remains metallic at low temperature, even a small amount of irradiation-induced disorder (one order of magnitude increase in room-temperature resistivity compared to pristine devices) produces a divergence of the resistivity and insulating behavior at low temperature for carrier densities below 4*10$^{12}$cm$^{-2}$.

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Authors

  • Jian-Hao Chen

    University of Maryland, College Park, Department of Physics and University of Maryland Materials Research Science and Engineering Center, University of Maryland, College Park, MD 20742, Dept of Physics, Center for Nanophysics and Advanced Materials, and Materials Research Science and Engineering Center, Univ. of Maryland, College Park, University of Maryland, Department of Physics, University of Maryland, Materials Research Science and Engineering Center, Center for Nanophysics and Advanced Materials, Dept of Physics, Univ. of Maryland, College Park, MD

  • William G. Cullen

    University of Maryland, Physics Department, University of Maryland, College Park, MD 20742, Materials Research Science and Engineering Center, Center for Nanophysics and Advanced Materials, Dept of Physics, Univ. of Maryland, College Park, MD, University of Maryland College Park, Dept. of Physics, U. of Maryland - College Park

  • Chaun Jang

    Materials Research Science and Engineering Center, Center for Nanophysics and Advanced Materials, Dept of Physics, Univ. of Maryland, College Park, MD

  • Michael Fuhrer

    University of Maryland, Department of Physics and Center for Nanophysics and Advanced Materials, University of Maryland College Park, Department of Physics and Center for Nanophysics and Advanced Materials, University of Maryland, College Park, MD 20742, USA, Materials Research Science and Engineering Center, Center for Nanophysics and Advanced Materials, Dept of Physics, Univ. of Maryland, College Park, MD, Materials Research Science and Engineering Center and Center for Nanophysics and Advanced Materials, Department of Physics, University of Maryland, Department of Physics and Center for Nanophysics and Advanced Materials, University of Maryland, College Park, MD 20742-4111, USA

  • Ellen Williams

    University of Maryland, College Park, Department of Physics and University of Maryland Materials Research Science and Engineering Center, University of Maryland, College Park, MD 20742, University of Maryland, LPS, CNAM, and the DOP, UM, Physics Department, University of Maryland, College Park, MD 20742, Materials Research Science and Engineering Center, Center for Nanophysics and Advanced Materials, Dept of Physics, Univ. of Maryland, College Park, MD, University of Maryland College Park, Dept. of Physics, U. of Maryland - College Park, Department of Physics and Center for Nanophysics and Advanced Materials, University of Maryland, College Park, MD 20742-4111, USA