Low temperature, field-dependent mobility in pentacene thin-film transistors.

We measure the field-effect and saturation mobility of Au bottom contact thin-film polycrystalline pentacene field-effect transistors while varying temperature, channel length, and gate voltage. We utilize Au bottom contacts without a wetting layer, and achieve contact resistance as low as 1 k$\Omega $-cm despite disturbance of the pentacene morphology at the drain and source electrodes. By measuring multiple channel lengths, we extract a contact-resistance free mobility. We confirm this value using an alternative technique in which we short the source and drain electrodes and make two terminal measurements of the capacitance and loss between these electrodes and the gate as a function of frequency. We discuss the result of field-dependent mobility in the context of Poole-Frenkel theory to rationalize the non-linear dependence of drain current on drain voltage, and test the predictions of recently developed models for transport in such systems.