Detection of Bottom Electrode Oxidation in Magnetic Tunnel Junctions via Exchange Bias Effect
ORAL
Abstract
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Authors
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Kevin West
Department of Materials Science and Engineering, University of Virginia
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Wei Chen
Department of Physics, University of Virginia
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Nam Dao
Department of Materials Science and Engineering, University of Virginia, Charlottsville, VA 22904, Department of Materials Science and Engineering, University of Virginia, Department of Materials and Engineering, University of Virginia
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David Kirkwood
Department of Materials Science and Engineering, University of Virginia, Charlottsville, VA 22904, Department of Materials Science and Engineering, University of Virginia, Department of Materials and Engineering, University of Virginia
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Jiwei Lu
University of Virginia, Department of Materials Science and Engineering, University of Virginia, Department of Materials and Engineering, University of Virginia
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Stuart Wolf
University of Virginia, Department of Materials Science and Engineering, University of Virginia, Charlottsville, VA 22904, Department of Materials Science and Engineering, University of Virginia, Department of Materials and Engineering and Department of Physics, University of Virginia