An Ultra High Vacuum Radio Frequency Scanning Tunneling Microscope

ORAL

Abstract

Radio frequency scanning tunneling microscope (RF-STM) utilizes a \textit{LC} resonant circuit to achieve impedance matching between the STM tunnel junction and 50-$\Omega $ high frequency electronics. This technique allows measurement bandwidths up to 10 MHz. We have built an ultra high vacuum (UHV) RF-STM system with in-situ tip and surface treatment as well as sample, tip and matching circuit exchange. In this talk, we will describe the basic operation of this system and discuss the application of UHV RF-STM to high frequency displacement detection. We will argue that UHV RF-STM is a suitable tool to measure back-action forces of tunneling electrons and other tip-sample interactions.

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Authors

  • Utku Kemiktarak

    Dept. of Physics, Boston University, Boston, MA 02215

  • Keith Schwab

    Cornell University, Department of Physics, Cornell University, Dept. of Physics, Cornell University, Ithaca NY 14853

  • Kamil Ekinci

    Center for Nanoscale Science and Technology, NIST, Gaithersburg, MD 20899 and Dept. of Mechanical Eng., Boston University, Boston, MA 02215