Absolute Penetration Depth in MgB$_{2}$

ORAL

Abstract

Absolute penetration depth measurements were carried out on single crystals of MgB$_{2}$. $\lambda $(0) was determined by sputtering an Al film onto the sample crystal and measuring the change in Meissner screening as the Al film expels flux. The change in screening was measured with a tunnel diode oscillator [1]. Several samples were sputtered with films of different thicknesses and measured. Thickness dependent changes in Hc and Tc of the thin Al films provided a self-consistency check on properties of the films. Subsequent analysis using FIB/SEM and AFM independently measured the film thickness and roughness. Work at UIUC supported by NSF DMR-05-03882. Work at the Ames Laboratory was supported by the Department of Energy, Basic Energy Sciences under Contract No. DE-AC02-07CH11358. [1] R. Prozorov, et al, Appl. Phys. Lett. 77, 4202 (2000)

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Authors

  • Nicholai Salovich

    Loomis Laboratory of Physics, Univ. of Illinois at Urbana-Champaign, Urbana IL 61801

  • Russell Giannetta

    Loomis Laboratory of Physics, Univ. of Illinois at Urbana-Champaign, Urbana IL 61801

  • Matt Tillman

    Ames Laboratory and Department of Physics and Astronomy, Iowa State Univeristy, Ames, Iowa 50011

  • P.C. Canfield

    Ames Laboratory and Department of Physics and Astronomy, Iowa State Univeristy, Ames, Iowa 50011, Ames Laboratory and Iowa State University, Ames Laboratory and Physics Department and Astronomy, Iowa State University, Ames, IA, Ames Laboratory, Ames Laboratory, US DOE and Iowa State University, Ames Laboratory/Department of Physics and Astronomy, Ames Lab / Iowa State University, Ames Laboratory/Iowa State University