Crystallographic Image Processing Software for Scanning Probe Microscopists

Following the common practice of structural electron crystallography, scanning probe microscopy (SPM) images can be processed ``crystallographically'' [1,2]. An estimate of the point spread function of the SPM can be obtained and subsequently its influence removed from the images. Also a difference Fourier synthesis can be calculated in order to enhance the visibility of structural defects. We are currently in the process of developing dedicated PC-based software for the wider SPM community. \\[4pt] [1] P. Moeck, B. Moon Jr., M. Abdel-Hafiez, and M. Hietschold, Proc. NSTI 2009, Houston, May 3-7, 2009, Vol. I (2009) 314-317, (ISBN: 978-1-4398-1782-7). \\[0pt] [2] P. Moeck, M. Toader, M. Abdel-Hafiez, and M. Hietschold, Proc. 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, May 11-14, 2009, Albany, New York, \textbf{\textit{Best Paper Award}}