A scaling analysis of the superconducting fluctuations in 2D InOx thin films
ORAL
Abstract
We apply a broadband microwave Corbino spectrometer covering the range from 10MHz to 20GHz to the study of 2D disordered superconducting InOx thin films. Explicit frequency dependency of the superfluid stiffness and conductivity are obtained down to 300mK. Via vacuum annealing, we investigate a broad range of disorder levels and transition temperatures in a single film. We perform a scaling analysis in which we can extract characteristic relaxation time of superconducting fluctuations. We discuss our results in terms of prevailing scenarios for fluctuation superconductivity and make connection to other experimental results.
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Authors
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Wei Liu
Johns Hopkins University
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Minsoo Kim
University at Buffalo-SUNY, SUNY-Buffalo
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Tai-lung Wu
Dept. of Physics, SUNY-Buffalo
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Sambandamurthy Ganapathy
Department of Physics, University at Buffalo-SUNY, Buffalo, NY 14260, University at Buffalo-SUNY, Dept. of Physics, University at Buffalo, SUNY, Dept. of Physics, University at Buffalo-SUNY, Buffalo, NY 14260, SUNY-Buffalo
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N.P. Armitage
Johns Hopkins University, JHU Dept. of Physics and Astronomy; JHU Institute for Quantum Matter