Focus Session: Complex Oxide Thin Films -- Oxide/Semiconductor Interfaces and Defects

FOCUS · Q33






Presentations

  • \textit{In-situ} XPS, STM and STS analyses of high k oxide/III-V interfaces

    ORAL

    Authors

    • Mao-Lin Huang

      Department of Physics, National Tsing Hua University

    • Yu-Shing Chang

      Department of Materials Science and Engineering, National Tsing Hua University

    • Pen Chang

      Department of Materials Science and Engineering, National Tsing Hua University

    • Han-Chin Chiu

      Department of Materials Science and Engineering, National Tsing Hua University

    • Jyun-Yang Shen

      Department of Materials Science and Engineering, National Tsing Hua University

    • Tsung-Da Lin

      Department of Materials Science and Engineering, National Tsing Hua University

    • J. Raynien Kwo

      President, the Physical Society of Taiwan, Department of Physics, National Tsing Hua University

    • Minghwei Hong

      Department of Materials Science and Engineering, National Tsing Hua University

    • Tun-Wen Pi

      National Synchrotron Radiation Research Center

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  • In situ synchrotron measurements of surface compensation mechanisms in La$_{0.6}$Sr$_{0.4}$Co$_{0.2}$Fe$_{0.8}$O$_{3-\delta}$ thin films

    ORAL

    Authors

    • Tim Fister

      Argonne National Laboratory

    • Stephan Hruszkewycz

      Argonne National Laboratory

    • Dillon Fong

      Argonne National Laboratory

    • Jeffrey Eastman

      Argonne National Laboratory

    • Paul Fuoss

      Argonne National Laboratory

    • Hui Du

      Carnegie Mellon University

    • Paul Salvador

      Carnegie Mellon University

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  • Controllable modification of fractured Nb-doped SrTiO$_{3}$ surfaces

    ORAL

    Authors

    • Nathan Guisinger

      Center for Nanoscale Materials, Argonne National Laboratory, Argonne National Laboratory

    • TeYu Chien

      Advanced Photon Source, Argonne National Laboratory, Argonne National Laboratory

    • Tiffany Santos

      CNM, Argonne National Lab, Argonne National Laboratory, Center for Nanoscale Materials, Argonne National Laboratory

    • Matthias Bode

      Center for Nanoscale Materials, Argonne National Laboratory, Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439 USA, Argonne National Laboratory

    • John W. Freeland

      Advanced Photon Source, Argonne National Laboratory, Argonne National Laboratory

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  • Nanometer-scale striped surface terminations on fractured SrTiO$_{3}$ surfaces

    ORAL

    Authors

    • Jeffrey Guest

      Center for Nanoscale Materials, Argonne National Laboratory, Argonne National Laboratory

    • Nathan Guisinger

      Center for Nanoscale Materials, Argonne National Laboratory, Argonne National Laboratory

    • Tiffany Santos

      CNM, Argonne National Lab, Argonne National Laboratory, Center for Nanoscale Materials, Argonne National Laboratory

    • TeYu Chien

      Advanced Photon Source, Argonne National Laboratory, Argonne National Laboratory

    • Anand Bhattacharya

      Argonne National Laboratory, Materials Science Division, Argonne National Laboratory, Materials Science Division and Center for Nanoscale Materials, Argonne National Laboratory

    • John W. Freeland

      Advanced Photon Source, Argonne National Laboratory, Argonne National Laboratory

    • Matthias Bode

      Center for Nanoscale Materials, Argonne National Laboratory, Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439 USA, Argonne National Laboratory

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  • Probing complex oxide interfaces by cross-sectional scanning tunneling microscopy

    ORAL

    Authors

    • TeYu Chien

      Advanced Photon Source, Argonne National Laboratory, Argonne National Laboratory

    • Jian Liu

      University of Arkansas, Dept. of Physics, U. of Arkansas

    • Jacques Chakhalian

      Physics Dept., University of Arkansas, University of Arkansas, Dept. of Physics, U. of Arkansas

    • Nathan Guisinger

      Center for Nanoscale Materials, Argonne National Laboratory, Argonne National Laboratory

    • John W. Freeland

      Advanced Photon Source, Argonne National Laboratory, Argonne National Laboratory

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  • Dislocation pileup in He implanted complex oxides

    ORAL

    Authors

    • Avishai Ofan

      Columbia University

    • Lihua Zhang

      Brookhaven National Laboratory

    • Ophir Gaathon

      Columbia University

    • K. Evans-Lutterodt

      Brookhaven National Laboratory, BNL-NSLS

    • Sasha Bakhru

      SUNY Albany

    • Hassaram Bakhru

      SUNY Albany

    • David Welch

      Brookhaven National Laboratory

    • Yimei Zhu

      Brookhaven National Laboratory, Brookhaven National Lab

    • Richard Osgood

      Columbia University, New York, NY, Columbia University

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  • First Principles Study of the Electronic Properties of Biaxially Strained Strontium Titanate

    ORAL

    Authors

    • Robert Berger

      Molecular Foundry, Lawrence Berkeley National Lab

    • Craig Fennie

      Cornell, School of Applied and Engineering Physics, Department of Applied and Engineering Physics, Cornell University, Ithaca, New York, School of Applied and Engineering Physics, Cornell University

    • Jeff Neaton

      Molecular Foundry, LBNL, Berkeley, CA 94720, Molecular Foundry, LBNL, Molecular Foundry, Lawrence Berkeley National Lab, Lawrence Berkeley National Laboratory, Molecular Foundry, Lawrence Berkeley National Laboratory

    View abstract →