Real time electron counting through wavelet edge detection

ORAL

Abstract

We have recently demonstrated single-shot measurements of individual electron spins in a Si/SiGe quantum dot. These experiments were analyzed using a wavelet-based technique that allows detection of charging events in real time. An alternative method, based on level thresholding, is not well suited for real time detection, due to drifting background currents in the charge sensor. In contrast, the wavelet technique relies on edge detection and is hence robust against drifting currents levels. In this talk, we describe our wavelet algorithm and its applications for charge sensing. We benchmark the performance of the algorithm under realistic signal noise conditions.

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Authors

  • Bjorn Van Bael

    University of Wisconsin-Madison

  • J.R. Prance

    University of Wisconsin-Madison

  • C.B. Simmons

    University of Wisconsin-Madison

  • Teck Seng Koh

    University of Wisconsin-Madison

  • Zhan Shi

    University of Wisconsin-Madison

  • D.E. Savage

    Material Science Center, University of Wisconsin, University of Wisconsin-Madison

  • Max Lagally

    University of Wisconsin-Madison, University of Wisconsin Madison

  • R. Joynt

    University of Wisconsin-Madison

  • Mark Friesen

    University of Wisconsin- Madison, University of Wisconsin-Madison, Department of Physics, Unviersity of Wisconsin-Madison, Madison WI 53706, U. of Wisconsin

  • S.N. Coppersmith

    University of Wisconsin- Madison, University of Wisconsin-Madison

  • Mark Eriksson

    Department of Physics, University of Wisconsin, University of Wisconsin-Madison, University of Wisconsin Madison