Characterization of EuO$_{1-x}$ thin films grown by oxidation of metallic Eu

EuO$_{1-x}$ is of interest due to the similarities between its magnetic and transport properties and those of the manganites, and it also holds potential for spintronics applications. We have grown polycrystalline EuO$_{1-x}$ films by oxidizing metallic Eu films. The films are characterized by x-ray diffraction, as well as measuring the resistivity and magnetization responses as a function of temperature. We will report on the relationship between the growth conditions and the properties of these samples, including a description of how annealing impacts the film properties.