Fabrication and properties of LuFe2O4 thin film

ORAL

Abstract

We have succeed in growing the LuFe2O4 polycrystalline thin film on the MgO(111) substrate with the Pulsed laser deposition(PLD) method. The surface structures, crystallographic and magnetic properties of the sample were characterized by XRD, AFM, SEM and SQUID. XRD pattern shows the sample crystallized in both (001) and (110) directions, which is also reflected in their morphological appearance in both AFM and SEM images. SQUID measurements reveal strong ferromagnetic signal in the thin film.

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Authors

  • Wenbin Wang

    University of Tennessee, University of Tennessee \& Oak Ridge National Lab

  • Xiaoshan Xu

    Oak Ridge National Lab, Department of Chemistry, University of Tennessee

  • Zheng Gai

    Oak Ridge National Lab, Oak Ridge National Laboratory \& Center for Nanophase Materials Science, Oak Ridge National Laboratory

  • Paul C. Snijders

    Oak Ridge National Lab, Oak Ridge National Laboratory

  • T. Zac Ward

    Oak Ridge National Lab, Oak Ridge National Laboratory

  • Jian Shen

    Oak Ridge National Lab, The University of Tennessee, Knoxville \& Fudan University, University of Tennessee \& Fudan University, The University of Tennessee / Fudan University, Fudan University; The University of Tennessee