Imaging grain boundaries in monolayer graphene by transmission electron microscopy

ORAL

Abstract

Using transmission electron microscopy (TEM), we investigate the structure of grain boundaries in large-area monolayer polycrystalline graphene sheets at micron and atomic length scales. At micron scale, grain boundary mapping is performed by electron diffraction and dark field imaging techniques. The atomic scale imaging by an aberration-corrected ultra-high resolution TEM reveals an alternating pentagon-heptagon structure along the high-angle tilt grain boundary.

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Authors

  • Kwanpyo Kim

    Department of Physics, UC Berkeley

  • Zonghoon Lee

    National Center for Electron Microscopy, Lawrence Berkeley National Laboratory

  • William Regan

    Department of Physics, UC Berkeley

  • C. Kisielowski

    National Center for Electron Microscopy, Lawrence Berkeley National Laboratory

  • Michael Crommie

    UC Berkeley, Department of Physics, UC Berkeley, Dept. of Physics at U.C. Berkeley / Lawrence Berkeley National Lab

  • A. Zettl

    UC Berkeley, Department of Physics, UC Berkeley, Department of Physics, University of California at Berkeley and Materials Sciences Division, Lawrence Berkeley National Laboratory, Department of Physics, University of California at Berkeley, Berkeley, CA 94720 U.S.A