Neutral donors interacting with a two-dimensional electron gas measured by electrically detected magnetic resonance up to 94GHz

ORAL

Abstract

Electrically detected magnetic resonance of a silicon field-effect transistor with channel-implanted donors is measured in a W-band ($94\:$GHz, $3.36\:$T) resonant microwave cavity. It is found that the two-dimensional electron gas (2DEG) resonance signal intensity increases by two orders of magnitude compared with conventional low-field X-band ($9.7\:$GHz, $0.35\:$T) measurements. On the other hand, the neutral donor resonance signals increase by over one order of magnitude. We interpret the results in terms of direct spin-dependent scattering and a polarization transfer from the donors to the 2DEG spin system.

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Authors

  • C.C. Lo

    University of California, Berkeley

  • Jeffrey Bokor

    University of California, Berkeley, EECS, UC Berkeley

  • V. Lang

    University of Oxford

  • Richard George

    University of Oxford

  • John Morton

    University of Oxford, Oxford University

  • A.M. Tyryshkin

    Princeton University

  • S.A. Lyon

    Princeton University

  • Thomas Schenkel

    Lawrence Berkeley National Laboratory, Lawrence Berkeley National Laboratory, Berkeley, CA