Escape and retrapping phenomena in HTS and LTS Josephson Junctions

ORAL

Abstract

We investigate escape and retrapping dynamics in Josephson junctions characterized by different levels of dissipation. Measurements are carried out both on high (HTS) and low (LTS) critical temperature superconductor Josephson systems, characterized by different types of barriers, i.e. grain boundary and standard insulating layers. Based on the damping level we observe various regimes ranging from macroscopic quantum tunneling, thermal activation and phase diffusion processes. Experimental data are compared with a numerical model allowing a precise determination of the damping parameter.

*We acknowledge partial support by STREP-MIDAS and by a Marie Curie International Reintegration Grant number 248933 ``hybMQC'' within the 7th European Community Framework Programme.

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Authors

  • L. Longobardi

    • Seconda Universit\`a degli Studi di Napoli, Dipartimento di Ingegneria dellaInformazione, via Roma 29, 81031 Aversa (Ce) Italy

  • D. Stornaiuolo

    • CNR-SPIN, UOS Napoli

  • D. Massarotti

    • Universit\`a degli Studi di Napoli, Dipartimento di Scienze Fisiche

  • L. Galletti

    • Universit\`a degli Studi di Napoli, Dipartimento di Scienze Fisiche

  • F. Carillo

    • NEST CNR-NANO, Pisa Italy

  • G. Papari

    • NEST CNR-NANO, Pisa Italy

  • A. Kawakami

    • Advanced ICT Research Institute, National Institute of Information and Communications Technology, 588-2 Iwaoka-cho, Nishi-ku, Kobe 651-2492, Japan

  • G.P. Pepe

    • Universit\`a degli Studi di Napoli, Dipartimento di Scienze Fisiche

  • A. Barone

    • Universit\`a degli Studi di Napoli, Dipartimento di Scienze Fisiche

  • G. Rotoli

    • Seconda Universit\`a degli Studi di Napoli, Dipartimento di Ingegneria della Informazione

  • F. Tafuri

    • Seconda Universit\`a degli Studi di Napoli, Dipartimento di Ingegneria della Informazione